Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - M. Muralidhar Singh,Ram Krishna,Ch Sateesh Kumar
-35% koodilla BOOKS
Toimitus 10-16 arkipäivässä
30 päivän palautusoikeus
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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Loppu
Kuvaus
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Lisätietoja
| Kirjoittaja | M. Muralidhar Singh, Ram Krishna, Ch Sateesh Kumar |
|---|---|
| Julkaisija | Taylor & Francis Ltd |
| Julkaisuvuosi | 2024 |
| Kannen tyyppi | Pehmeäkantinen |
| EAN | 9781032375113 |