Kaikki kirjat 35 % alennuksella koodilla: BOOKS

  • check Yli 10 miljoonaa kirjaa
  • check Uutuuksia joka päivä
  • check Yli 1 miljoona asiakasta luottaa meihin
  • check Hyvät hinnat ja alennukset
  • check Toimitus koko Eurooppaan

Electromigration: Studied with the Optical Microscopy Imaging Method - Linghong Li

englanti
2008-10-10
64,79 € 99,68 €

-35% koodilla BOOKS

Toimittajalla varastossa

Toimitus 10-16 arkipäivässä

30 päivän palautusoikeus

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose ... Täydellinen kuvaus

Saatat myös pitää

Kuvaus

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only provides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non- contact mode.

Lisätietoja

Kirjoittaja Linghong Li
Julkaisija VDM Verlag
Julkaisuvuosi 2008
Kannen tyyppi Pehmeäkantinen
EAN 9783639088137
Kirjoita oma arvostelusi
Arvostelet: Electromigration: Studied with the Optical Microscopy Imaging Method
Arvostelusi:

Goodreads-arvostelut

64,79 € 99,68 €