(Ipf)Microelectronic Reliability - Edward B Hakim
-25% koodilla BOOKS
Toimitus 22-28 arkipäivässä
30 päivän palautusoikeus
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Kuvaus
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Lisätietoja
| Kirjoittaja | Edward B Hakim |
|---|---|
| Julkaisija | Artech House Publishers |
| Julkaisuvuosi | 1989 |
| Kannen tyyppi | Kovakantinen |
| EAN | 9780890062845 |