Microstructural Characterisation Techniques - Gunturi Venkata Sitarama Sastry
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Toimitus 12-18 arkipäivässä
30 päivän palautusoikeus
This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electro ... Täydellinen kuvaus
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Kuvaus
This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
Lisätietoja
| Kirjoittaja | Gunturi Venkata Sitarama Sastry |
|---|---|
| Julkaisija | Springer Nature Singapore |
| Series | Indian Institute of Metals Series |
| Julkaisuvuosi | 2023 |
| Kannen tyyppi | Pehmeäkantinen |
| EAN | 9789811935114 |