Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs - Alexandra Zimpeck,Laurent Artola,Cristina Meinhardt,Ricardo Reis
-25% koodilla BOOKS
Toimitus 17-23 arkipäivässä
30 päivän palautusoikeus
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of dev ... Täydellinen kuvaus
Saatat myös pitää
TOP
Determined: The Science of Life Without Free Will
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Light Eaters: How the Unseen World of Plant Intelligence Offers a New Understanding of Life on Earth
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Why We Sleep: Unlocking the Power of Sleep and Dreams
-25% koodilla BOOKS
Varastossa
TOP
The Rise and Fall of the Dinosaurs: A New History of a Lost World
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Biology: A Global Approach, Global Edition
Neil Campbell, Rebecca Orr, Lisa Urry, Peter Minorsky, Michael Cain, Jane Reece, Steven Wasserman
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Six Not-so-easy Pieces: Einstein's Relativity, Symmetry, and Space-Time
Richard P. Feynman, Robert B. Leighton, Matthew Sands
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Age of Alchemy: How Early Innovators Shaped Modern Chemistry
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Secrets of our DNA: How Genetics has Changed the World
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Janeway's Immunobiology
Leslie J. Berg, Kenneth Murphy, Casey Weaver
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
How to Solve it: A New Aspect of Mathematical Method
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Factfulness: Ten Reasons We're Wrong About the World--and Why Things Are Better Than You Think
Ola Rosling, Anna Rosling Rönnlund, Hans Rosling
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Why Machines Learn: The Elegant Maths Behind Modern AI
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Feynman Lectures on Physics. The New Millennium Edition
Matthew Sands, Robert Leighton, Richard Feynman
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Seven Brief Lessons on Physics
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Entangled Life: How Fungi Make Our Worlds, Change Our Minds and Shape Our Futures
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Life As No One Knows It: The Physics of Life's Emergence
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Rise and Reign of the Mammals: A New History, from the Shadow of the Dinosaurs to Us
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
Learn Faster, Perform Better: A Musician's Guide to the Neuroscience of Practicing
-25% koodilla BOOKS
Toimittajalla varastossa
TOP
The Road to Reality: A Complete Guide to the Laws of the Universe
-25% koodilla BOOKS
Toimittajalla varastossa
Kuvaus
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regardingthe area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.
Lisätietoja
| Kirjoittaja | Alexandra Zimpeck, Laurent Artola, Cristina Meinhardt, Ricardo Reis |
|---|---|
| Julkaisija | Springer Nature Switzerland |
| Julkaisuvuosi | 2021 |
| Kannen tyyppi | Kovakantinen |
| EAN | 9783030683672 |