Scan Statistics - Joseph Glaz,Sylvan Wallenstein,Joseph Naus
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Toimitus 17-23 arkipäivässä
30 päivän palautusoikeus
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of sc ... Täydellinen kuvaus
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Kuvaus
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.
Lisätietoja
| Kirjoittaja | Joseph Glaz, Sylvan Wallenstein, Joseph Naus |
|---|---|
| Julkaisija | Springer US |
| Series | Springer Series in Statistics |
| Julkaisuvuosi | 2001 |
| Kannen tyyppi | Kovakantinen |
| EAN | 9780387988191 |