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Soft-Matter Characterization -

englanti
2008-12-04
2 168,64 € 3 336,37 €

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Pehmeäkantinen Kovakantinen
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Toimitus 28-34 arkipäivässä

30 päivän palautusoikeus

This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, tech ... Täydellinen kuvaus

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This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.

Lisätietoja

Julkaisija Springer
Julkaisuvuosi 2008
EAN 9781402082900
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2 168,64 € 3 336,37 €