Test and Diagnosis for Small-Delay Defects - Krishnendu Chakrabarty,Mohammad Tehranipoor,Ke Peng
-35% koodilla BOOKS
Toimitus 17-23 arkipäivässä
30 päivän palautusoikeus
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process varia ... Täydellinen kuvaus
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Kuvaus
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Lisätietoja
| Kirjoittaja | Krishnendu Chakrabarty, Mohammad Tehranipoor, Ke Peng |
|---|---|
| Julkaisija | Springer US |
| Julkaisuvuosi | 2011 |
| Kannen tyyppi | Kovakantinen |
| EAN | 9781441982964 |