Test Pattern Generation using Boolean Proof Engines - Daniel Tille,Stephan Eggersglüß,Görschwin Fey,Rolf Drechsler
-25% koodilla BOOKS
Toimitus 12-18 arkipäivässä
30 päivän palautusoikeus
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of a ... Täydellinen kuvaus
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Kuvaus
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Lisätietoja
| Kirjoittaja | Daniel Tille, Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler |
|---|---|
| Julkaisija | Springer Netherlands |
| Julkaisuvuosi | 2010 |
| Kannen tyyppi | Pehmeäkantinen |
| EAN | 9789048184910 |