X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures - Martin Schmidbauer
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This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as qu ... Täydellinen kuvaus
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Kuvaus
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Lisätietoja
| Kirjoittaja | Martin Schmidbauer |
|---|---|
| Julkaisija | Springer Berlin Heidelberg |
| Series | Springer Tracts in Modern Physics |
| Julkaisuvuosi | 2004 |
| Kannen tyyppi | Kovakantinen |
| EAN | 9783540201793 |