Kirjat Arnaud Virazel
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Patrick Girard, Arnaud Virazel, Luigi Dilillo, Alberto Bosio, Serge Pravossoudovitch
-25% koodilla BOOKS
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Patrick Girard, Luigi Dilillo, Arnaud Virazel, Alberto Bosio, Serge Pravossoudovitch
-25% koodilla BOOKS
Toimittajalla varastossa